Improvement in sensitivity of an indirect-type organic X-ray detector using an amorphous IGZO interfacial layer

To improve the power conversion efficiency (PCE) and sensitivity of indirect-type organic X-ray detectors, we examined the role of amorphous indium-gallium-zinc-oxide (a-IGZO) as an interfacial layer placed between the PBDB-T: PCBM active layer and the LiF/Al cathode. By RF magnetron sputtering, a-IGZO films with different thicknesses were deposited on a PBDB-T: PCBM active layer at room temperature. The optimized detector with a 10.1 nm a-IGZO...