High-quality, high-throughput cryo-electron microscopy data collection via beam tilt and astigmatism-free beam-image shift

The throughput of cryo-electron microscopy (cryo-EM) can be improved by employing a procedure that collects beam-image shift data. However, this procedure inadvertently induces a beam tilt, thus decreasing the resolution of the reconstruction. Here, we report an automatic calibration procedure for correcting the beam tilt and a large unexpected astigmatism in the beam-image shift data collection. In this procedure, the changes of the beam tilt...