Variable‐fidelity response feature surrogates for accelerated statistical analysis and yield estimation of compact microwave components

Accounting for manufacturing tolerances is an essential part of a reliable microwave design process. Yet, quantification of geometry and/or material parameter uncertainties is challenging at the level of full-wave electromagnetic (EM) simulation models. This is due to inherently high cost of EM analysis and massive simulations necessary to conduct the statistical analysis. Here, a low-cost and accurate yield estimation procedure for compact...