XPS and ToF-SIMS characterization of the surface oxides on lean duplex stainless steel – Global and local approaches
Abstract
This work reports an innovative methodology based on the coupling of XPS and ToF-SIMS in order to study the surface oxide layer formed on austenite and ferrite phases of duplex stainless steels. The native oxide film obtained after mechanical polishing and the passive film obtained after electrochemical passivation in 0.05 M H2SO4 were investigated. Chromium and molybdenum contents were found to be higher in the oxide layer formed on ferrite...
Paper Details
Title
XPS and ToF-SIMS characterization of the surface oxides on lean duplex stainless steel – Global and local approaches
Published Date
Jul 1, 2019
Journal
Volume
155
Pages
121 - 133
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