Intensity-based matching and registration for 3D correlative microscopy with large discrepancies
Published: Apr 1, 2018
Abstract
Correlative microscopy, especially light and electron microscopy (CLEM), enables the study of cells and subcellular elements in complementary ways, provided a reliable registration between images is efficiently achievable. We propose a general automatic registration method. Due to large discrepancies in appearance, field-of-view, resolution and position, a pre-alignment stage is required before any 3D fine registration stage. We define an...
Paper Details
Title
Intensity-based matching and registration for 3D correlative microscopy with large discrepancies
Published Date
Apr 1, 2018
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