A non-destructive technique for chemical mapping of insect inclusions in amber

Volume: 92, Issue: 4, Pages: 733 - 741
Published: Jun 8, 2018
Abstract
Synchrotron-based techniques offer a wealth of elemental, molecular, and structural insights in biological samples, but the application of these techniques to fossils is a relatively new development. Here we examine how synchrotron radiation micro X-ray fluorescence (SR µXRF) may be used to investigate the chemical composition of insects trapped in amber, while leaving the inclusions unaltered. Elemental distribution data could provide important...
Paper Details
Title
A non-destructive technique for chemical mapping of insect inclusions in amber
Published Date
Jun 8, 2018
Volume
92
Issue
4
Pages
733 - 741
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