Grain Boundary Mapping in Polycrystalline Graphene
Abstract
We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic...
Paper Details
Title
Grain Boundary Mapping in Polycrystalline Graphene
Published Date
Jan 31, 2011
Journal
Volume
5
Issue
3
Pages
2142 - 2146
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