Review paper
Some practical considerations for effective and efficient wafer-level reliability control
Abstract
In this paper, some practical considerations for effective and efficient wafer-level reliability control (WLRC) are presented. We propose a better solution to replace the previous method by adding a protection diode to avoid process induced charging damage on test structure devices. This work also provides in-depth discussions on WLR Via electromigration (EM), which correlated well with traditional time-consuming package-level tests. In...
Paper Details
Title
Some practical considerations for effective and efficient wafer-level reliability control
Published Date
Aug 1, 2004
Journal
Volume
44
Issue
8
Pages
1233 - 1243
Citation AnalysisPro
You’ll need to upgrade your plan to Pro
Looking to understand the true influence of a researcher’s work across journals & affiliations?
- Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
- Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.
Notes
History