Deep Phenotyping of Yield-Related Traits in Wheat

Volume: 10, Issue: 4, Pages: 603 - 603
Published: Apr 23, 2020
Abstract
The complex formation of grain yield (GY) is related to multiple dry matter (DM) traits; however, due to their time-consuming determination, they are not readily accessible. In winter wheat (Triticum aestivum L.), both agronomic treatments and genotypic variation influence GY in interaction with the environment. Spectral proximal sensing is promising for high-throughput non-destructive phenotyping but was rarely evaluated systematically for...
Paper Details
Title
Deep Phenotyping of Yield-Related Traits in Wheat
Published Date
Apr 23, 2020
Journal
Volume
10
Issue
4
Pages
603 - 603
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