Revealing nanoscale dynamics during an epoxy curing reaction with x-ray photon correlation spectroscopy

The evolution of nanoscale properties is measured during the thermally triggered curing of an industrial epoxy adhesive. We use x-ray photon correlation spectroscopy (XPCS) to track the progression of the curing reaction through the local dynamics of filler particles that reflect the formation of a thermoset network. Out-of-equilibrium dynamics are resolved through identification and analysis of the intensity–intensity autocorrelation functions...