QTL mapping for yield-related traits in wheat based on four RIL populations

Volume: 133, Issue: 3, Pages: 917 - 933
Published: Jan 2, 2020
Abstract
Eight environmentally stable QTL for grain yield-related traits were detected by four RIL populations, and two of them were validated by a natural wheat population containing 580 diverse varieties or lines. Yield and yield-related traits are important factors in wheat breeding. In this study, four RIL populations derived from the cross of one common parent Yanzhan 1 (a Chinese domesticated cultivar) and four donor parents including Hussar (a...
Paper Details
Title
QTL mapping for yield-related traits in wheat based on four RIL populations
Published Date
Jan 2, 2020
Volume
133
Issue
3
Pages
917 - 933
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