Original paper
SAD phasing of XFEL data depends critically on the error model
Volume: 75, Issue: 11, Pages: 959 - 968
Published: Oct 30, 2019
Abstract
A nonlinear least-squares method for refining a parametric expression describing the estimated errors of reflection intensities in serial crystallographic (SX) data is presented. This approach, which is similar to that used in the rotation method of crystallographic data collection at synchrotrons, propagates error estimates from photon-counting statistics to the merged data. Here, it is demonstrated that the application of this approach to SX...
Paper Details
Title
SAD phasing of XFEL data depends critically on the error model
Published Date
Oct 30, 2019
Volume
75
Issue
11
Pages
959 - 968
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