PSPHV: A Surface-Potential-Based Model for LDMOS Transistors

This article presents PSPHV, a surface-potential-based compact model for laterally diffused MOS (LDMOS) transistors. PSPHV includes a new drain voltage scaling technique that enables accurate modeling of saturation in transistors with nonuniform lateral doping; gate bias-dependent interface charge, which models the gradual channel turn- ON seen in devices with halo doping; internal drain bias clamping, which eliminates the capacitance spikes...