Double dose efficiency of the yellow rust resistance gene Yr17 in bread wheat lines
Abstract
Yellow rust, caused by Puccinia striiformis f. sp. tritici, is one of the most severe wheat disease worldwide. Crop losses have ranged from 10% to 70% and up to 100% in extreme conditions. Eighty‐two resistance genes, designated Yr , have been identified. Among them, Yr17 derived from Aegilops ventricosa and located on chromosome 2A has been widely used in wheat breeding. However, it had been overcome already. Through recombination of the Ae....
Paper Details
Title
Double dose efficiency of the yellow rust resistance gene Yr17 in bread wheat lines
Published Date
Oct 25, 2019
Journal
Volume
139
Issue
2
Pages
263 - 271
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