Test Pattern Generator for MV-Based QCA Combinational Circuit Targeting MMC Fault Models
Abstract
Quantum-dot-Cellular Automata (QCA) is emerging as one of the alternatives for Integrated Circuit Technology considering the scaling limitations of current Complementary Metal Oxide Semiconductor (CMOS) technology. Being at molecular scale, defects are more likely to occur in QCA devices. Therefore, the substantial development of QCA-oriented defects, its corresponding fault models and test generation is required. This paper addresses the fault...
Paper Details
Title
Test Pattern Generator for MV-Based QCA Combinational Circuit Targeting MMC Fault Models
Published Date
Oct 17, 2019
Journal
Volume
68
Issue
3
Pages
1812 - 1822
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