Automated label‐free detection of injured neuron with deep learning by two‐photon microscopy

Volume: 13, Issue: 1
Published: Oct 30, 2019
Abstract
Stroke is a significant cause of morbidity and long‐term disability globally. Detection of injured neuron is a prerequisite for defining the degree of focal ischemic brain injury, which can be used to guide further therapy. Here, we demonstrate the capability of two‐photon microscopy (TPM) to label‐freely identify injured neurons on unstained thin section and fresh tissue of rat cerebral ischemia‐reperfusion model, revealing definite diagnostic...
Paper Details
Title
Automated label‐free detection of injured neuron with deep learning by two‐photon microscopy
Published Date
Oct 30, 2019
Volume
13
Issue
1
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