A Differential Probe with Integrated Balun for On-wafer Measurements in the WR-3.4 (220 – 330 GHz) Waveguide Band
Published: Jun 1, 2019
Abstract
This paper demonstrates the first differential on-wafer probe with integrated balun operating in the WR-3.4 (220 - 330 GHz) waveguide band. The probe employs integrated balun circuitry to convert the single-ended signal from the waveguide output of a VNA into differential stimuli at the on-wafer transmission line output. The design approach, fabrication method and measured results are described in this...
Paper Details
Title
A Differential Probe with Integrated Balun for On-wafer Measurements in the WR-3.4 (220 – 330 GHz) Waveguide Band
Published Date
Jun 1, 2019
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