Grain Scattering Noise Modeling and Its Use in the Detection and Characterization of Defects Using Ultrasonic Arrays

In the field of ultrasonic array imaging for non-destructive testing (NDT), material structural noise caused by grain scattering is one of the main sources of error when characterizing defects that are found in the polycrystalline materials. The existence of grains can also severely affect the detection performance of ultrasonic testing, making small defects indistinguishable from the grain indications due to ultrasonic attenuation and...