Review paper
A comprehensive model for transient behavior of tapping mode atomic force microscope
Abstract
Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode atomic force microscopy (TM-AFM). However, a transient dynamic model—which is essential for a model-based control design—is still missing. In this paper, we derive a mathematical model which covers both the transient and steady-state behavior. The steady-state response of the proposed model has been validated with existing theories. Its transient...
Paper Details
Title
A comprehensive model for transient behavior of tapping mode atomic force microscope
Published Date
Jul 1, 2019
Journal
Volume
97
Issue
2
Pages
1601 - 1617
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