X-ray standing wave technique with spatial resolution: In-plane characterization of surfaces and interfaces by full-field x-ray fluorescence imaging
Abstract
The present paper describes a powerful extension of the x-ray standing-wave technique that combines it with the capability of full-field x-ray fluorescence imaging, so that the impurity depth profiles at all different parts of a nanolayer material can be measured in parallel. The imaging capability improves the robustness and reliability of the x-ray standing-wave technique in investigating inhomogeneous two-dimensional materials and soft...
Paper Details
Title
X-ray standing wave technique with spatial resolution: In-plane characterization of surfaces and interfaces by full-field x-ray fluorescence imaging
Published Date
Feb 12, 2019
Journal
Volume
3
Issue
2
Pages
023802
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