Loss Characterization and Analysis of High Voltage E-mode GaN HEMT in Soft-switching Application

Published: Oct 1, 2018
Abstract
Application of wide band gap (WBG) devices are getting a sharp rise in the recent power electronics sector, due to their superior performance when compared to silicon. Even though GaN devices provide a promising efficiency and power density numbers, but high frequency operation limits these benefits. This leaves behind a space for the realization of high frequency based soft switching topologies, which in combination with the GaN makes the...
Paper Details
Title
Loss Characterization and Analysis of High Voltage E-mode GaN HEMT in Soft-switching Application
Published Date
Oct 1, 2018
Citation AnalysisPro
  • Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
  • Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.