Understanding the influence of grain scattering noise on array imaging and defect characterisation

Volume: 144, Issue: 3, Pages: 1781 - 1782
Published: Oct 19, 2018
Abstract
The performance of ultrasonic inspection degrades for coarse grained materials because of the multiple scattering effects caused by the material microstructure. The influence of grain scattering noise on detection and characterisation of defects is studied in this paper. Two parameters, mean grain size and grain size variation, are used to describe a particular grain structure, which is included in a finite element (FE) model to simulate the...
Paper Details
Title
Understanding the influence of grain scattering noise on array imaging and defect characterisation
Published Date
Oct 19, 2018
Volume
144
Issue
3
Pages
1781 - 1782
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