A fast X-ray-diffraction-based method for the determination of crystal size distributions (FXD-CSD)

A procedure for a fast X-ray-diffraction-based crystal size distribution analysis, named FXD-CSD, is presented. The method enables the user, with minimal sample preparation, to determine the crystal size distribution (CSD) of crystalline powders or polycrystalline materials, derived via an intensity scaling procedure from the diffraction intensities of single Bragg spots measured in spotty diffraction patterns with a two-dimensional detector....