Review paper
Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience
Abstract
Nanoscience is a booming field incorporating some of the most fundamental questions concerning structure, function, and applications. The cutting-edge research in nanoscience requires access to advanced techniques and instrumentation capable of approaching these unanswered questions. Over the past few decades, atomic force microscopy (AFM) has been developed as a powerful platform, which enables in situ characterization of topological...
Paper Details
Title
Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience
Published Date
Oct 13, 2018
Journal
Volume
7
Issue
6
Pages
605 - 621
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