TEM and electron backscatter diffraction analysis (EBSD) on superconducting nanowires

Electrospun, superconducting nanowires are characterized concerning the grain orientation, their texture and the respective grain boundary misorientations by means of electron backscatter diffraction (EBSD) analysis. The individual nanowires in such electrospun, nonwoven nanowire networks of Bi2Sr2CaCu2Ox (Bi-2212) are polycrystalline, have average diameters up to 250 nm and their grains are in the 20-50 nm range. This requires a high spatial...