A novel sample preparation method for ultra-high vacuum (UHV) secondary ion mass spectrometry (SIMS) analysis
Volume: 33, Issue: 9, Pages: 1559 - 1563
Published: Jan 1, 2018
Abstract
Secondary ion mass spectrometry (SIMS) has been applied to analyze a wide range of materials for earth science research due to its high sensitivity, high precision and capacity for in situ ...
Paper Details
Title
A novel sample preparation method for ultra-high vacuum (UHV) secondary ion mass spectrometry (SIMS) analysis
Published Date
Jan 1, 2018
Volume
33
Issue
9
Pages
1559 - 1563
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