Microstructures of bitumen observed by environmental scanning electron microscopy (ESEM) and chemical analysis using time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Abstract
null null The aim of this study is to characterize structures induced on bitumen surfaces under analysis by environmental scanning electron microscopy (ESEM), and to examine possible contributing factors to the formation of their formation. Various bitumen samples are investigated, including soft and hard, as well as polymer modified bitumen. Chemical characterization is carried out by time-of-flight secondary ion mass spectrometry (TOF-SIMS),...
Paper Details
Title
Microstructures of bitumen observed by environmental scanning electron microscopy (ESEM) and chemical analysis using time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Published Date
Oct 1, 2018
Journal
Volume
229
Pages
198 - 208
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