Research progress of radiation effects mechanisms and experimental techniques in nano-devices

Volume: 63, Issue: 13, Pages: 1211 - 1222
Published: May 1, 2018
Abstract
Radiation damage in electronic devices is one of the key factors determining the survival probability of on-orbit spacecraft. Thus, it has remained an important topic in the field of radiation-hardening technology. High reliability, high integration, high performance, low power consumption, and low cost are the important requirements for the development of next-generation electronic systems. For space electronic systems, the use of...
Paper Details
Title
Research progress of radiation effects mechanisms and experimental techniques in nano-devices
Published Date
May 1, 2018
Volume
63
Issue
13
Pages
1211 - 1222
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