Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry

Volume: 7, Issue: 1
Published: Oct 23, 2017
Abstract
Combining dissimilar transition metal oxides (TMOs) into artificial heterostructures enables to create electronic interface systems with new electronic properties that do not exist in bulk. A detailed understanding of how such interfaces can be used to tailor physical properties requires characterization techniques capable to yield interface sensitive spectroscopic information with monolayer resolution. In this regard resonant x-ray reflectivity...
Paper Details
Title
Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry
Published Date
Oct 23, 2017
Volume
7
Issue
1
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