Cryogenic temperature, 2-port, on-wafer characterization at WR-5.1 frequencies

IMS 2016
Pages: 1 - 4
Published: May 22, 2016
Abstract
We demonstrate 2-port, on-wafer S-parameter characterization at WR-5.1 frequencies and cryogenic temperatures. CAD-based simulation optimized the thermal pathways for the probe station, waveguide and probe...
Paper Details
Title
Cryogenic temperature, 2-port, on-wafer characterization at WR-5.1 frequencies
Published Date
May 22, 2016
Journal
Pages
1 - 4
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