Predict VLSI Circuit Reliability Risks Using Neural Network
Abstract
This paper describes the challenges faced in predicting the reliability of very large scale integration (VLSI) circuits. Currently, lots of trial-and-errors are still needed for the parameters selected to develop a neural network prediction model, whose result is with a great deal of uncertainty. The objective of this paper is to provide a novel and practical approach to design a reliability prediction model using neural network. We propose a...
Paper Details
Title
Predict VLSI Circuit Reliability Risks Using Neural Network
Published Date
Jul 1, 2014
Volume
2
Issue
5
Pages
116 - 123
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