Atomic-scale assessment of the crystallization onset in silicon carbonitride

Volume: 35, Issue: 12, Pages: 3355 - 3362
Published: Oct 1, 2015
Abstract
Within the present study, atomic-scale electron microscopy investigation on the crystallization behavior of polysilylcarbodiimide-derived SiCN was performed. The as-prepared SiCN sample was found to be homogeneous and consisted of amorphous silicon nitride nano-domains dispersed within an amorphous, highly entangled graphene-like carbon matrix. Annealing of the sample at 1400 °C induced a slight increase of the ordering of the carbon phase....
Paper Details
Title
Atomic-scale assessment of the crystallization onset in silicon carbonitride
Published Date
Oct 1, 2015
Volume
35
Issue
12
Pages
3355 - 3362
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