Variability of nanoscale triple gate FinFETs: Prediction and analysis method
Published: Dec 1, 2014
Abstract
Our analytical compact drain current model for undoped or lightly doped nanoscale FinFETs has been successfully used to predict variability in the electrical characteristics of FinFETs. A simplified version of the model behaves almost as good as the analytical model but is more computational time efficient. Implementation of the models in verilog-A can be used to predict variability in circuits such as the...
Paper Details
Title
Variability of nanoscale triple gate FinFETs: Prediction and analysis method
Published Date
Dec 1, 2014
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