Luminescence imaging for the detection of shunts on silicon solar cells

Luminescence imaging is a non‐destructive, fast, and versatile imaging method for spatially resolved solar cell and material characterization. In this paper, we investigate its ability to detect shunts on silicon solar cells. We give a detailed description of the relation between local junction voltage and local luminescence signal. This relation is important because shunts drain majority currents causing voltage drops across the surrounding...