Direct sampling time-of-flight mass spectrometers for technological analysis

Volume: 361, Issue: 3, Pages: 261 - 266
Published: Jun 8, 1998
Abstract
The practicability of direct sampling time-of-flight mass spectrometers for routine technological analysis is considered. The discussed set incorporates two TOF instruments together covering analysis of solid, liquid, and gas samples without the need for time consuming sample preparation. Both an electron ionization reflectron TOF mass analyzer designed for the analysis of gas and liquid samples and a laser ionization axial electrostatic TOF...
Paper Details
Title
Direct sampling time-of-flight mass spectrometers for technological analysis
Published Date
Jun 8, 1998
Volume
361
Issue
3
Pages
261 - 266
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