Process Reliability Data Comparison Guidance and Practise in Advanced Semiconductor Manufacturing Quality Control

Published: Jan 1, 2014
Abstract
This paper introduces a guidance, which is displayed by a flow chart, for the process reliability data comparison of advanced semiconductor technologies. The present semiconductor manufacturing process is very complex and its quality control requirement also becomes more and more strict. Different reliability data may analyzed by different methods considering both engineering and statistical evidence so we can best assess process reliability...
Paper Details
Title
Process Reliability Data Comparison Guidance and Practise in Advanced Semiconductor Manufacturing Quality Control
Published Date
Jan 1, 2014
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