Scanning Hall probe microscopy
Abstract
We describe the implementation of a scanning Hall probe microscope of outstanding magnetic field sensitivity (∼0.1 G) and unprecedented spatial resolution (∼0.35 μm) to detect surface magnetic fields at close proximity to a sample. Our microscope combines the advantages of a submicron Hall probe fabricated on a GaAs/Al0.3Ga0.7As heterostructure chip and the scanning tunneling microscopy technique for precise positioning. We demonstrate its...
Paper Details
Title
Scanning Hall probe microscopy
Published Date
Oct 19, 1992
Journal
Volume
61
Issue
16
Pages
1974 - 1976
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