Two-dimensional power spectral density measurements of x-ray optics with the Micromap interferometric microscope
Abstract
A procedure and software have been developed to transform the area distribution of the residual surface heights available from the measurement with the Micromap interferometric microscope into a two-dimensional (2D) power spectral density (PSD) distribution of the surface height. The procedure incorporates correction of one of the spectral distortions of the PSD measurement. The distortion appears as a shape difference between the tangential and...
Paper Details
Title
Two-dimensional power spectral density measurements of x-ray optics with the Micromap interferometric microscope
Published Date
Jun 30, 2005
Journal
Citation AnalysisPro
You’ll need to upgrade your plan to Pro
Looking to understand the true influence of a researcher’s work across journals & affiliations?
- Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
- Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.
Notes
History