Relationship between Growth Traits and Spectral Vegetation Indices in Durum Wheat

Future wheat yield improvements may be gained by increasing total dry matter (TDM) production. Vegetation indices (VI) based on spectral reflectance ratios have been proposed as an appropriate method to assess TDM and leaf area index (LAI) in wheat. This study was undertaken to determine whether VI could accurately identify TDM and LAI in durum wheat [Triticum turgidum var. durum (Desf.) Bowden [= T. turgidum subsp. durum (Desf.) Husn.]) and...