Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume

Volume: 7405, Pages: 192 - 202
Published: Aug 20, 2009
Abstract
We have measured the pixel response and derived the spectral modulation transfer function (MTF) of a front-side illuminated complementary-metal-oxide-semiconductor (CMOS) focal plane array at wavelengths of 440, 544, 633, and 905 nanometers using a spot scanning technique. The spot scanning apparatus utilized a confocal microscope configuration with a spot diameter about 1.4 μm (wavelength dependent) to scan the CMOS imager 9-μm pixel pitch...
Paper Details
Title
Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume
Published Date
Aug 20, 2009
Volume
7405
Pages
192 - 202
Citation AnalysisPro
  • Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
  • Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.