QTL mapping for yield and yield contributing traits in two mapping populations of bread wheat
Abstract
In bread wheat, single-locus and two-locus QTL analyses were conducted for seven yield and yield contributing traits using two different mapping populations (P I and P II). Single-locus QTL analyses involved composite interval mapping (CIM) for individual traits and multiple-trait composite interval mapping (MCIM) for correlated yield traits to detect the pleiotropic QTLs. Two-locus analyses were conducted to detect main effect QTLs (M-QTLs),...
Paper Details
Title
QTL mapping for yield and yield contributing traits in two mapping populations of bread wheat
Published Date
Oct 25, 2006
Journal
Volume
19
Issue
2
Pages
163 - 177
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