X‐Ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy Study of Passive Films Formed on (100) Fe‐18Cr‐13Ni Single‐Crystal Surfaces

X‐ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) were combined to investigate the thickness, chemical composition, and structure of passive films formed in 0.5 M on (100)Fe‐18Cr‐13Ni. The XPS measurements show that aging under polarization at +500 mV/SHE causes a dehydration reaction of the outer chromium hydroxide layer of the passive film. This reaction results in a thickening of the mixed Cr(III) and Fe(III)...