A practical guide to the selection of independent components of the electroencephalogram for artifact correction

Electroencephalographic data are easily contaminated by signals of non-neural origin. Independent component analysis (ICA) can help correct EEG data for such artifacts. Artifact independent components (ICs) can be identified by experts via visual inspection. But artifact features are sometimes ambiguous or difficult to notice, and even experts may disagree about how to categorise a particular component. It is therefore important to inform users...