Multiple superimposed probability tomography on a second electrical field

Volume: 6, Issue: 1, Pages: 82 - 86
Published: Feb 24, 2009
Abstract
Based on the requirement of probability tomography, we developed two-directional pole–pole measurement on a 2D electrical imaging survey which is able to extract all second electrical field profiles to participate in probability tomography. The concept of charge occurrence probability (COP) is defined as the average of cross-correlation of the space domain scanning (SDS) function with the second electrical field being generated by a whole set of...
Paper Details
Title
Multiple superimposed probability tomography on a second electrical field
Published Date
Feb 24, 2009
Volume
6
Issue
1
Pages
82 - 86
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