Second order statistics based blind source separation for artifact correction of short ERP epochs
Published: Jul 9, 2004
Abstract
ERP is commonly obtained by averaging over segmented EEC epochs. In case artifacts are present in the raw EEC measurement, pre-processing is required to prevent the averaged ERP waveform being interfered by artifacts. The simplest pre-processing approach is by rejecting trials in which presence of artifact is detected. Alternatively artifact correction instead of rejection can be performed by blind source separation, so that waste of ERP trials...
Paper Details
Title
Second order statistics based blind source separation for artifact correction of short ERP epochs
Published Date
Jul 9, 2004
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