Near-field optical characterization of quantum wells and nanostructures

Published: Dec 17, 2002
Abstract
Summary form only given. Low temperature near-field scanning optical microscopy/spectroscopy has proven useful in characterization of quantum confined semiconductor structures even to the extent of revealing the individual optically active quantum constituents of such a system. Specifically, sharp (<0.07 meV), spectrally distinct emission lines of a GaAs/AlGaAs quantum well can be imaged at a specific spatial location, or as a spectral evolution...
Paper Details
Title
Near-field optical characterization of quantum wells and nanostructures
Published Date
Dec 17, 2002
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