Electron backscattering diffraction as a complementary analytical approach to the microstructural characterization of ancient materials by electron microscopy
Volume: 72, Pages: 193 - 201
Published: Oct 1, 2015
Abstract
Since the development of electron backscattering diffraction (EBSD), scanning electron microscopy (SEM) has become a powerful tool for characterizing the local crystallography of bulk materials at the nanoscale. Although EBSD is now a well-established characterization method in materials science, it has rarely been used in art and archaeology, and nearly exclusively in metallic materials. However, EBSD could also be exploited to characterize...
Paper Details
Title
Electron backscattering diffraction as a complementary analytical approach to the microstructural characterization of ancient materials by electron microscopy
Published Date
Oct 1, 2015
Volume
72
Pages
193 - 201
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