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Kjeld Møller Pedersen
Aalborg University
493Publications
23H-index
2,913Citations
Publications 496
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#1Annette Willemoes Holst-Kristensen (AAU: Aalborg University)
#2Kirsten Fonager (AAU: Aalborg University)H-Index: 22
Last.Kjeld Møller Pedersen (AAU: Aalborg University)H-Index: 23
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Purpose To investigate the test–retest reliability of Investigating Choice Experiments Capability measure for Adults (ICECAP-A) in the adult Danish population.
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#1Ievgen Boturchuk (AU: Aarhus University)
#2T. Walter (TU Wien: Vienna University of Technology)H-Index: 2
Last.Vladimir Popok (AAU: Aalborg University)H-Index: 20
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Formation of ohmic contacts to GaN is of high practical importance for device fabrication. Due to the wide band gap, formation of multilayer metal structures is required to make electrical connections with low contact resistance. The paper presents a study on structure, composition, adhesion and electrical properties of Ti/Al/Ti/Au and Ta/Al/Ta metal stacks fabricated by e-beam evaporation and thermal annealing in order to provide ohmic contacts to n-type GaN films grown on Si. For the Ti-based ...
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#1R. R. Juluri (AU: Aarhus University)H-Index: 10
#2John Lundsgaard Hansen (AU: Aarhus University)H-Index: 11
Last.Kjeld Møller Pedersen (AAU: Aalborg University)H-Index: 23
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Last.Merethe Kirstine Kousgaard Andersen (University of Southern Denmark)H-Index: 4
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The aim of this article is to show how Jurgen Habermas’ communicative action theory serves as a useful tool in analysing and interpreting empirical data on how Danish general practitioners experien...
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#1Hans Ulrik Ulriksen (AAU: Aalborg University)H-Index: 3
#2Thomas SøndergaardH-Index: 29
Last.Kjeld Møller Pedersen (AAU: Aalborg University)H-Index: 23
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Light scattering from nanostructures is an essential ingredient in several optical technologies, and experimental verification of simulations of light scattering is important. In particular, solar cells may benefit from light-trapping due to scattering. However, light that is successfully trapped in an absorbing media such as e.g. Si necessarily escapes direct detection. We present in this paper a technique for direct measurement and analysis of light scattering from nanostructures on a surface,...
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